Single and Multicomponent Digital Optical Signal Analysis

Single and Multicomponent Digital Optical Signal Analysis

Estimation of phase and its derivatives

Pramod Rastogi, Rishikesh Kulkarni

$150.00

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Description

Optical techniques such as electronic speckle pattern interferometry, holographic interferometry, and fringe projection have emerged as the prominent tools for non-contact measurements, with applications ranging from biology to materials science. In these processes, information about the measured physical quantity is stored in the phase or associated derivatives of an interference fringe pattern. Consequently, a reliable estimation of phase and its derivatives, commonly referred to as fringe analysis becomes a primary requirement for the application and interpretation of these optical techniques. Here, leading researchers in fringe analysis methods present a review of the tools and methods of multicomponent fringe analysis and interferometric data, and outline a wide range of digital signal-processing-based interferometric data-processing techniques.


Author

Pramod Rastogi:
Rishikesh Kulkarni is a doctorial assistant and researcher at EPFL in Switzerland.

Pramod Rastogi is a professor at the EPFL in Switzerland and has published more than 180 scientific papers and has edited eight books in the field of optical metrology. A recipient of many awards including the SPIE Dennis Gabor Award and Society for Experimental Mechanics Hetényi Award. He is a Fellow of the Society of the Photo-Optical Instrumentation Engineers and the Optical Society of America as well as a member of the Swiss Academy of Engineering Sciences.

|||Rishikesh Kulkarni is a doctorial assistant and researcher at EPFL in Switzerland.

Pramod Rastogi is a professor at the EPFL in Switzerland and has published more than 180 scientific papers and has edited eight books in the field of optical metrology. A recipient of many awards including the SPIE Dennis Gabor Award and Society for Experimental Mechanics Hetényi Award. He is a Fellow of the Society of the Photo-Optical Instrumentation Engineers and the Optical Society of America as well as a member of the Swiss Academy of Engineering Sciences.

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